CEMMNT

Main Activity in Nanotechnology

Material Manufacturer

About Company

The Centre of Excellence in Metrology for Micro and Nano Technologies (CEMMNT) delivers comprehensive measurement, characterisation and analytical solutions. From single measurements to bespoke R&D projects, CEMMNT provides single point access to over 50 techniques and 250 inter-disciplinary specialists from industry leading partners. Our unique systems engineering expertise assists companies embedding micro and nanotechnologies into product and processes.

Key capabilites include:

• Surface analysis of chemical, elemental, structural, mechanical thermal and other properties
• Measurment of critical dimensions, form and rouyghness of materials and devices
• Thin and mnulit-layer film characterisation
• Nanoparticle measurment and characterisation
• Defect and contaminat detection
• Systems Engineering consultancy

Core techniques include:

• Microscopy: optical, electron and atomic force
• Profilometry: optical and stylus
• Depth profiling (SIMS)
• X-ray Diffraction, Topography and Reflection
• Spectroscopy: Infra-red and Raman
• X-ray Photoelectron Spectroscopy and Auger

Our core partners, BAE Systems, Coventor, QinetiQ, the National Physical Laboratory and Taylor Hobson and associate service provider, Smith and Nephew work together to offer complementary expertise for all industry sectors across the complete product lifecycle.