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AFM - Atomic force microscope

AFM stands for Atomic Force Microscopy or Atomic Force Microscope. AFM, also referred to as SPM or Scanning Probe Microscopy, is a high-resolution imaging technique that can resolve features as small as an atomic lattice in the real space. It allows researchers to observe and manipulate molecular and atomic level features. Atomic force microscopy is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer. Atomic Force Microscopy has much broader potential and application because it can be used for imaging any conducting or non-conducting surface.

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